Search results for: Suying Yao
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1104 - 1117
IEEE Transactions on Electron Devices > 2016 > 63 > 1 > 32 - 41
Journal of Signal Processing Systems > 2016 > 82 > 1 > 17-25
The Journal of Supercomputing > 2016 > 72 > 6 > 2283-2309
IEEE Sensors Journal > 2015 > 15 > 6 > 3265 - 3273
Microprocessors and Microsystems > 2015 > 39 > 3 > 189-199
Microelectronics Reliability > 2015 > 55 > 3-4 > 463-469
Transactions of Tianjin University > 2015 > 21 > 1 > 83-89
Journal of Electronic Testing > 2015 > 31 > 5-6 > 537-548
Microelectronics Reliability > 2014 > 54 > 5 > 993-999
Microelectronics Reliability > 2014 > 54 > 4 > 755-763
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 4 > 951 - 956
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 7 > 1952 - 1961
Journal of Signal Processing Systems > 2014 > 75 > 1 > 1-13