Search results for: F. Irom
IEEE Transactions on Nuclear Science > 2013 > 60 > 3-2 > 1953 - 1969
Microelectronics Reliability > 2010 > 50 > 9-11 > 1832-1836
IEEE Transactions on Nuclear Science > 2010 > 57 > 1-2 > 266 - 271
IEEE Transactions on Nuclear Science > 2008 > 55 > 1-3 > 649 - 655
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3352 - 3359
IEEE Transactions on Nuclear Science > 2007 > 54 > 6-1 > 2547 - 2553
IEEE Transactions on Nuclear Science > 2006 > 53 > 6-1 > 3455 - 3461
Physics Letters B > 1995 > 344 > 1-4 > 91-97