Wyniki wyszukiwania dla: Changhwan Shin
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1846 - 1854
2010 IEEE International Reliability Physics Symposium > 1117 - 1121
IEEE Transactions on Electron Devices > 2010 > 57 > 6 > 1301 - 1309
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1846 - 1854
2010 IEEE International Reliability Physics Symposium > 1117 - 1121
IEEE Transactions on Electron Devices > 2010 > 57 > 6 > 1301 - 1309