Wyniki wyszukiwania dla: Chenyue Ma
2015 IEEE International Reliability Physics Symposium > XT.5.1 - XT.5.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 818 - 825
Microelectronics Reliability > 2011 > 51 > 2 > 337-341
IEEE Electron Device Letters > 2011 > 32 > 7 > 955 - 957
2010 International Electron Devices Meeting > 20.4.1 - 20.4.4