Search results for: Shurong Dong
Solid-State Electronics > 2017 > 137 > C > 128-133
Solid-State Electronics > 2016 > 116 > C > 80-87
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 495 - 499
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 606 - 614
IEEE Electron Device Letters > 2010 > 31 > 8 > 845 - 847