Search results for: T. Mrotzek
Microelectronics Reliability > 2012 > 52 > 12 > 3022-3025
International Journal of Refractory Metals and Hard Materials > 2010 > 28 > 6 > 716-721
International Journal of Refractory Metals and Hard Materials > 2010 > 28 > 6 > 709-715
International Journal of Refractory Metals and Hard Materials > 2006 > 24 > 4 > 298-305