Search results for: Meng-Hsueh Chiang
Advanced Materials > 31 > 15 > n/a - n/a
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4193 - 4199
Microelectronics Reliability > 2017 > 74 > C > 22-26
IEEE Journal of the Electron Devices Society > 2017 > 5 > 3 > 164 - 169
IEEE Electron Device Letters > 2017 > 38 > 1 > 91 - 94
2016 IEEE Silicon Nanoelectronics Workshop (SNW) > 118 - 119
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 903 - 909
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2176 - 2183
Solid-State Electronics > 2014 > 92 > C > 57-62
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 3949 - 3954
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2760 - 2766
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2371 - 2377
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4062 - 4069
IEEE Transactions on Electron Devices > 2014 > 61 > 4 > 963 - 968