Search results for: M. Porti
Microelectronic Engineering > 2017 > 178 > C > 66-70
IEEE Electron Device Letters > 2017 > 38 > 5 > 637 - 640
IEEE Electron Device Letters > 2017 > 38 > 4 > 457 - 460
IEEE Transactions on Nanotechnology > 2016 > 15 > 6 > 986 - 992
IEEE Electron Device Letters > 2016 > 37 > 5 > 640 - 643
Microelectronic Engineering > 2015 > 147 > C > 335-338
Microelectronic Engineering > 2015 > 147 > C > 31-36
2015 IEEE International Reliability Physics Symposium > CD.4.1 - CD.4.6
Microelectronic Engineering > 2013 > 109 > Complete > 129-132
2013 IEEE International Reliability Physics Symposium (IRPS) > 5D.4.1 - 5D.4.6
Advanced Materials > 25 > 10 > 1440 - 1444
2013 Spanish Conference on Electron Devices > 269 - 272
2013 Spanish Conference on Electron Devices > 281 - 284
Microelectronics Reliability > 2012 > 52 > 9-10 > 2110-2114
2011 International Electron Devices Meeting > 6.3.1 - 6.3.4