Search results for: J. H. Lee
Archives of Metallurgy and Materials > 2015 > Vol. 60, iss. 2B > 1491--1497
2013 IEEE International Reliability Physics Symposium (IRPS) > 3E.1.1 - 3E.1.5
IEEE Electron Device Letters > 2012 > 33 > 1 > 20 - 22
IEEE Electron Device Letters > 2011 > 32 > 9 > 1194 - 1196
Electronics Letters > 2010 > 46 > 21 > 1450 - 1452
Synthetic Metals > 1997 > 91 > 1-3 > 297-299