Search results for: Steve Stoffels
SID Symposium Digest of Technical Papers > 54 > 1 > 1101 - 1104
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 79 - 86
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 38 - 44
IEEE Electron Device Letters > 2017 > 38 > 12 > 1696 - 1699
Microelectronics Reliability > 2017 > 78 > C > 148-155
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3616 - 3621
IEEE Electron Device Letters > 2017 > 38 > 3 > 371 - 374
IEEE Electron Device Letters > 2017 > 38 > 1 > 99 - 102
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3451 - 3458
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3479 - 3486
Microelectronics Reliability > 2016 > 64 > C > 547-551
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2321 - 2327
physica status solidi (a) > 213 > 5 > 1229 - 1235
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1853 - 1860
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Electron Device Letters > 2016 > 37 > 3 > 310 - 313
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 997 - 1004
Microelectronics Reliability > 2016 > 58 > C > 151-157
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730