Search results for: Nobukazu Takai
Journal of Electronic Testing > 2013 > 29 > 6 > 879-892
Analog Integrated Circuits and Signal Processing > 2013 > 75 > 2 > 207-216
Analog Integrated Circuits and Signal Processing > 2000 > 25 > 3 > 271-279
Journal of Electronic Testing > 2013 > 29 > 6 > 879-892
Analog Integrated Circuits and Signal Processing > 2013 > 75 > 2 > 207-216
Analog Integrated Circuits and Signal Processing > 2000 > 25 > 3 > 271-279