Search results for: Basel Halak
Circuits, Systems, and Signal Processing > 2019 > 38 > 10 > 4739-4761
Microelectronics Reliability > 2017 > 79 > C > 79-90
IET Circuits, Devices & Systems > 2017 > 11 > 4 > 304 - 309
Microelectronics Reliability > 2016 > 67 > C > 74-81
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 5 > 1688 - 1701
Circuits, Systems, and Signal Processing > 2016 > 35 > 10 > 3644-3674