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In this paper, we describe a design and characterization flow to accurately extract the performance of high-speed devices, integrated in Silicon-based technologies. An EM-based technique to accurately derive the characteristic impedance of transmission lines embedded in lossy and multilayered substrates, is described. Further, this technique is employed to characterize lower metal levels transmission...
In this contribution we present a numerical and experimental analysis of the multimode propagation over coplanar transmission lines, in order to define guidelines for substrate selection to achieve accurate wafer-level (sub)mm-wave calibrations. Losses and coupling effects resulting from the multiple propagating modes on transmission lines conventionally employed for probe-level calibrations, are...
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