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Low cost of test solution is always been pursued and challenged in semiconductor industry as the cost becomes more and more sensitive in current competitive market. This paper shows a new test method for RF devices with short test time, which features one RF ATE (Automatic Test Equipment) working with 2 turret handlers in parallel. The throughput for the similar RF devices is almost double of the...
In this work, we introduce the Growth Curve Analysis Tool (GCAT). GCAT is designed to enable efficient analysis of high-throughput microbial growth curve data collected from cultures grown in microtiter plates. GCAT is accessible through a web browser, making it easy to use and operating system independent. GCAT implements fitting of global sigmoid curve models and local regression (LOESS) model....
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