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The reliability and safety of modern analog devices, e.g. in automotives, aircraft or consumer electronics, is influenced by many input parameters like supply voltage, ambient temperature or load resistances. In certain regions of this large parameter space, the device exhibits degraded performance or it fails completely. The validation of such a device has to find the regions of the input parameter...
In this paper we propose to exploit so called Mission Profiles to address increasing requirements on safety and power efficiency for automotive power ICs. These Mission Profiles constrain the required device performance space to valid application scenarios. Mission Profile data can be represented in arbitrary forms like temperature histograms or cumulated drive cycle data. Hence, the derivation of...
In this paper we present a concept for assessing the robustness of automotive smart power ICs through lab measurements with respect to application variance and parameter spread. Classical compliance to the product specification, where only minimum and maximum values are defined, is not enough to assess device robustness since complex transients of application components cannot be defined within single...
The paper focuses on treating and characterizing variations that occur in measurements or that are intrinsic in electronic systems. Methods illustrating basic principles of Design of Experiments such as replication and blocking are implemented and used so that valid and objective conclusions are drawn. Replication is used for three purposes: verifying the metamodel adequacy, defining the confidence...
In this paper we present a fully automated approach to consider device-to-device variances of automotive power applications during post-silicon verification. Due to the high complexity of target applications for automotive smart power microelectronics, it is not sufficient to affirm compliance to their specification. Car manufacturers therefore push for more extensive application robustness beyond...
Automotive power micro-electronic devices in the past were low pin-count, low complexity devices. Robustness could be assessed by stressing the few operating conditions and by manual analysis of the simple analog circuitry. Nowadays complexity of Automotive Smart Power Devices is driven by the demands for energy efficiency and safety, which adds the need for additional monitoring circuitry, redundancy,...
In this paper we present a new concept of an application-oriented characterization method for automotive power micro-electronic devices. Automotive power semiconductors are mainly influenced by their real-life application but there is no sufficient method yet to assess device robustness within their application. For that reason we established a first approach to emulate different automotive power...
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