Search results for: D. Linten
2010 International Electron Devices Meeting > 35.5.1 - 35.5.4
2010 International Electron Devices Meeting > 35.4.1 - 35.4.4
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 130 - 141
Microelectronics Reliability > 2009 > 49 > 12 > 1440-1446
2009 31st EOS/ESD Symposium > 1 - 6
2009 31st EOS/ESD Symposium > 1 - 6
2009 31st EOS/ESD Symposium > 1 - 7
2009 31st EOS/ESD Symposium > 1 - 9
IEEE Transactions on Instrumentation and Measurement > 2009 > 58 > 10 > 3418 - 3426
2009 31st EOS/ESD Symposium > 1 - 10