Wyniki wyszukiwania dla: Dhamin Al-Khalili
Journal of Electronic Testing > 2018 > 34 > 3 > 351-362
10th IEEE International NEWCAS Conference > 385 - 388
Analog Integrated Circuits and Signal Processing > 2012 > 70 > 2 > 165-179
Journal of Signal Processing Systems > 2010 > 58 > 1 > 3-15
Microelectronics Journal > 2008 > 39 > 12 > 1809-1816
Circuits, Systems, and Signal Processing > 2008 > 27 > 5 > 713-731
Integration, the VLSI Journal > 2006 > 39 > 4 > 382-406
Integration, the VLSI Journal > 2002 > 32 > 1-2 > 77-97
Integration, the VLSI Journal > 1999 > 27 > 2 > 143-163