Search results for: Jyi-Tsong Lin
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4937 - 4945
Microelectronics Reliability > 2017 > 74 > C > 22-26
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1561 - 1567
IEEE Journal of the Electron Devices Society > 2017 > 5 > 1 > 59 - 63
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 441 - 444
IEEE Electron Device Letters > 2016 > 37 > 9 > 1127 - 1130
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 903 - 909
Journal of Display Technology > 2015 > 11 > 2 > 152 - 156