Search results for: Chang-Hsien Lin
2015 IEEE International Electron Devices Meeting (IEDM) > 32.2.1 - 32.2.4
2015 IEEE International Electron Devices Meeting (IEDM) > 22.6.1 - 22.6.4
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 897 - 901
2013 IEEE International Reliability Physics Symposium (IRPS) > ME.1.1 - ME.1.4