Search results for: Jose Rodrigo Azambuja
Microelectronics Reliability > 2017 > 76-77 > C > 665-669
Microelectronics Reliability > 2014 > 54 > 5 > 1050-1055
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4243 - 4250
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2768 - 2775
IEEE Transactions on Nuclear Science > 2011 > 58 > 6-1 > 2855 - 2862
Journal of Electronic Testing > 2011 > 27 > 4 > 541-550