Search results for: S. Barraud
Microelectronics Reliability > 2017 > 79 > C > 111-118
Solid-State Electronics > 2017 > 131 > C > 20-23
IEEE Electron Device Letters > 2017 > 38 > 4 > 414 - 417
physica status solidi (b) > 254 > 3 > n/a - n/a
Solid-State Electronics > 2017 > 128 > C > 155-162
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2061 - 2068
Solid-State Electronics > 2016 > 125 > C > 175-181
Microelectronics Reliability > 2016 > 63 > C > 1-10
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 781 - 786
Solid-State Electronics > 2016 > 115 > PB > 167-172
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions... > 2015 > 365 > PB > 631-635
Microelectronic Engineering > 2015 > 147 > C > 10-14
Solid State Electronics > 2015 > 112 > Complete > 78-84
Electronics Letters > 2015 > 51 > 17 > 1364 - 1366
IEEE Transactions on Nuclear Science > 2015 > 62 > 3-3 > 1226 - 1232
Solid State Electronics > 2015 > 108 > Complete > 36-41
Water Research > 2015 > 72 > C > 239-250
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1628 - 1634
Environmental Science and Pollution Research > 2014 > 21 > 8 > 5267-5281