Search results for: Valentin Bissuel
Microelectronics Reliability > 2018 > 87 > C > 222-231
Microelectronics Reliability > 2016 > 67 > C > 54-63
International Journal of Thermal Sciences > 2016 > 109 > C > 23-32
Solid State Electronics > 2015 > 103 > Complete > 30-39