Search results for: A. Rhallabi
Microelectronics Reliability > 2015 > 55 > 9-10 > 1750-1753
IEEE Transactions on Plasma Science > 2012 > 40 > 4 > 959 - 971
Journal of Electronic Materials > 2010 > 39 > 6 > 688-693
2009 IEEE MTT-S International Microwave Symposium Digest > 1017 - 1020
Applied Surface Science > 2008 > 254 > 11 > 3576-3584
Materials Science & Engineering B > 2008 > 147 > 2-3 > 136-140
Materials Science in Semiconductor Processing > 2006 > 9 > 1-3 > 225-229
Microelectronic Engineering > 1998 > 41-42 > 391-394