Search results for: J.-P. Landesman
Journal of Materials Science: Materials in Electronics > 2018 > 29 > 15 > 13254- 13264
physica status solidi c > 11 > 11‐12 > 1618 - 1621
2013 Spanish Conference on Electron Devices > 273 - 276
Microelectronics Reliability > 2010 > 50 > 9-11 > 1744-1749
Journal of Electronic Materials > 2010 > 39 > 6 > 688-693
Microelectronics Reliability > 2007 > 47 > 9-11 > 1680-1684
Materials Science in Semiconductor Processing > 2006 > 9 > 1-3 > 225-229
IEEE Sensors, 2005. > 4 pp.