Search results for: Yoann Mamy Randriamihaja
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 2 > 660 - 669
Microelectronics Reliability > 2012 > 52 > 11 > 2513-2520
Solid State Electronics > 2012 > 71 > Complete > 74-79
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 610 - 620
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 621 - 630
Journal of Computational Electronics > 2012 > 11 > 3 > 225-237