Search results for: Atsushi Ohoka
Microelectronics Reliability > 2016 > 58 > C > 158-163
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2401 - 2405
Microelectronics Reliability > 2016 > 58 > C > 158-163
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2401 - 2405