Search results for: B Narasimham
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3336 - 3341
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3176 - 3182
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3386 - 3391
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 157 - 163
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3477 - 3482
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3115 - 3121
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3050 - 3056
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3483 - 3488
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 325 - 333
IEEE Transactions on Semiconductor Manufacturing > 2009 > 22 > 1 > 119 - 125
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 1 > 203 - 209
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3342 - 3346
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3456 - 3460
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3130 - 3135
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 2854 - 2860