Search results for: P. Gouker
Microelectronics Reliability > 2011 > 51 > 6 > 1113-1117
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3005
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3115 - 3121
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3483 - 3488
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 2854 - 2860
Microelectronic Engineering > 2001 > 59 > 1-4 > 285-289