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This paper presents memory-based embedded digital ATE (Automatic Test Equipment) - a new logic BIST methodology that can deliver deterministic test stimuli and stores output responses on a chip. The proposed scheme consists of test data compression logic and a new on-chip SRAM structure, which is operated as a ROM when the logic BIST mode is on. The new BIST-oriented RAM (BRAM) implements ROM features...
We have prepared pentacene films on Si, Al2O3, and glass substrates by thermal evaporation and have investigated their optical properties at room temperature over a wide range of frequencies from infrared to ultraviolet (5 meV to 6.5 eV). A series of optical phonon modes and electronic transitions have been observed. The internal vibrational modes in the infrared region match well their molecular...
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