Wyniki wyszukiwania dla: C Sturm
2011 International Reliability Physics Symposium > 2E.3.1 - 2E.3.5
IEEE Electron Device Letters > 2011 > 32 > 1 > 36 - 38
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2381 - 2389
2011 International Reliability Physics Symposium > 2E.3.1 - 2E.3.5
IEEE Electron Device Letters > 2011 > 32 > 1 > 36 - 38
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2381 - 2389