Search results for: Dong Seup Lee
2016 IEEE International Reliability Physics Symposium (IRPS) > 4A-3-1 - 4A-3-6
physica status solidi c > 10 > 5 > 827 - 830
IEEE Electron Device Letters > 2013 > 34 > 7 > 849 - 851
IEEE Electron Device Letters > 2013 > 34 > 8 > 969 - 971
2012 International Electron Devices Meeting > 13.6.1 - 13.6.4
IEEE Electron Device Letters > 2012 > 33 > 7 > 976 - 978
IEEE Electron Device Letters > 2012 > 33 > 3 > 324 - 326
2011 International Electron Devices Meeting > 19.2.1 - 19.2.4
IEEE Electron Device Letters > 2011 > 32 > 6 > 755 - 757
IEEE Electron Device Letters > 2011 > 32 > 5 > 617 - 619
IEEE Electron Device Letters > 2011 > 32 > 5 > 623 - 625
IEEE Electron Device Letters > 2011 > 32 > 11 > 1525 - 1527
IEEE Transactions on Nanotechnology > 2009 > 8 > 4 > 492 - 497