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With high-speed receivers and clock data recovery (CDR) blocks operating at speeds in excess of 10 Gbps, stringent CDR jitter tolerance test criteria are necessary to qualify device reliability. A robust CDR jitter tolerance test should accommodate test criteria with extremely low bit error rate (BER) values, usually 10-12 or lower for typical industrial protocols. Using conventional methods, the...
High data rates, high clock speeds, and low power consumption are synonymous with advanced electronic devices. Consequently, simultaneous switching noise (SSN) is emerging as a critical side-effect of toggling signals within an electronic device because SSN affects signal integrity. Even minute changes in signal voltage in the order of a few millivolts can adversely affect the functioning of a circuit...
High-performance systems that involve tightly-constrained design parameters create significant challenges for board designers. The ability to simulate a complex design before laying out the board has become a critical factor in the success of a project. From the manufacturers' standpoint, releasing a SPICE model involves the risk of exposing confidential circuit netlists. Altera provides the IBIS...
This paper analyzes the effects of the PCB signal via depth on the simultaneous switching noise (SSN) in a field programmable gate array (FPGA) device. SSN consists of two distinct components: mutual inductive coupling noise and power distribution network (PDN) noise. This paper presents an experimental study of the PCB signal via depth effects on mutual inductive coupling noise using an Altera FPGA...
With the increase in data processing speeds, the requirement for a clean reference clock source for high-speed data processing is paramount. A clean reference clock source for a high-speed data system must satisfy the following criteria: generates a clock signal with very fast rising and falling edges, exhibits low intrinsic jitter and does not add additional jitters through the clock distribution...
With the increase of data rate and clock speed, as well as the decrease of power supply voltage on todaypsilas technology, simultaneous switching noise (SSN) has become critical in order for the entire system to have an error free design. The difference in a few milli-volts may cause the system to fail. Therefore, it is very important to understand the characteristics of the SSN glitch of an active...
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