Search results for: Liyi Xiao
physica status solidi (a) > 219 > 6 > n/a - n/a
Journal of Electronic Testing > 2019 > 35 > 3 > 413-420
Nuclear Instruments and Methods in Physics Research Section A: Accelerators,... > 2018 > 885 > C > 98-104
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 802 - 804
IEEE Transactions on Reliability > 2017 > 66 > 2 > 518 - 528
Microelectronics Reliability > 2017 > 73 > C > 92-96
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1593 - 1600
Microelectronics Reliability > 2017 > 69 > C > 126-129
Electronics Letters > 2016 > 52 > 23 > 1922 - 1923
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 388 - 395
Microelectronics Reliability > 2016 > 63 > C > 278-283
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 269 - 271