Search results for: Lorena Anghel
Journal of Electronic Testing > 2018 > 34 > 4 > 375-387
Microprocessors and Microsystems > 2017 > 54 > C > 14-25
IEEE Design & Test > 2015 > 32 > 2 > 17 - 28
Microprocessors and Microsystems > 2014 > 38 > 6 > 620-635