Search results for: L F Edge
2015 IEEE International Reliability Physics Symposium > 2F.5.1 - 2F.5.6
2013 IEEE International Electron Devices Meeting > 9.2.1 - 9.2.4
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 996 - 1005
2010 International Electron Devices Meeting > 11.4.1 - 11.4.4
IEEE Transactions on Electron Devices > 2010 > 57 > 11 > 2814 - 2820
Journal of Materials Science: Materials in Electronics > 2007 > 18 > 7 > 735-741