Search results for: Ph Roussel
2017 IEEE International Reliability Physics Symposium (IRPS) > 2D-6.1 - 2D-6.7
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-1-1 - 6C-1-7
2015 IEEE International Electron Devices Meeting (IEDM) > 5.6.1 - 5.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 14.5.1 - 14.5.4
2014 IEEE International Electron Devices Meeting > 34.4.1 - 34.4.4
2013 IEEE International Electron Devices Meeting > 21.2.1 - 21.2.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 2F.4.1 - 2F.4.8
2011 International Electron Devices Meeting > 12.4.1 - 12.4.4
2010 International Electron Devices Meeting > 4.4.1 - 4.4.4
Microelectronics Reliability > 2007 > 47 > 7 > 1016-1024
Microelectronics Reliability > 2007 > 47 > 4-5 > 559-566