Wyniki wyszukiwania dla: Y Hayashi
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 98 - 105
2010 International Electron Devices Meeting > 33.3.1 - 33.3.4
IEEE Transactions on Semiconductor Manufacturing > 2008 > 21 > 2 > 256 - 262
IEEE Transactions on Semiconductor Manufacturing > 2008 > 21 > 3 > 469 - 480
IEEE Transactions on Electron Devices > 2007 > 54 > 8 > 1867 - 1877
IEEE Translation Journal on Magnetics in Japan > 1994 > 9 > 1 > 124 - 128
IEEE Translation Journal on Magnetics in Japan > 1994 > 9 > 1 > 129 - 133
IEEE Translation Journal on Magnetics in Japan > 1994 > 9 > 6 > 27 - 32