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Ball pull test has emerged to be an attractive alternative to the traditional ball shear method for characterizing the attachment strength of solder interconnection. Since it is a relatively new development, so far there is not industrial standard to regulate this testing method. This paper discusses the effect of IMC growth after soldering and thermal aging at 150 degC. The attachment strength of...
The drive for lead-free solders in the microelectronics industry presents some new reliability challenges. Sn-Ag-Cu alloys are leading candidates for lead-free solders. Compared to traditional Sn-Pb solders, Sn-Ag-Cu solders are easily corroded in corrosive environment due to their special structure. The presence of Ag3Sn in Sn-Ag-Cu solders accelerates the dissolution of tin from solder matrix into...
A new thermal-fatigue life prediction equation for a plastic ball grid array (PBGA) package with 95.5wt%Sn4.0wt%Ag0.5wt%Cu lead-free solder balls is proposed in this investigation. The test vehicle consists of the PBGA package, a lead-free PCB, and a lead-free solder paste (95.5wt%Sn3.9wt%Ag0.6wt%Cu). The coefficients of the fatigue equation presented herein are determined by best fit of the test...
Ball pull test has emerged to be an attractive alternative to the traditional ball shear testing method for characterizing the attachment strength of solder interconnection. Since this is a relatively new development, so far there is no industrial standard to regulate this testing method. In this study, the pull and shear tests are performed on plastic ball grid array (PBGA) solder balls with Sn-4...
3D packaging (3DP) is an emerging trend as a solution for microelectronics development toward system in package (SiP). 3D flip chip stacking structures with through silicon vias (TSVs) have very good potential for the implementation of 3D packaging. In this study, a prototype of multistack flip chip 3D packaging with TSVs for interconnection is designed and fabricated. Processing techniques for prototype...
This study is intended to investigate the effects of irregular conditions on the board level solder joint reliability during accelerated thermal cycling tests. In a previous research, the thermal fatigue lives of PBGA solder joints have been estimated using a 2-dimensional finite element model. The computational results agreed very well with the experimental data. In the present study, with the previously...
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