Search results for: P.-J. Wagner
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.3.1 - 2D.3.6
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.8.1 - XT.8.7
2011 International Electron Devices Meeting > 27.4.1 - 27.4.4
2010 International Electron Devices Meeting > 4.4.1 - 4.4.4
Microelectronics Reliability > 2009 > 49 > 9-11 > 1013-1017
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 106 - 114