Search results for: Ming-Dou Ker
2014 IEEE International Reliability Physics Symposium > EL.5.1 - EL.5.2
2014 IEEE International Reliability Physics Symposium > EL.1.1 - EL.1.4
ELECTROPHORESIS > 35 > 2-3 > 330 - 336
IEEE Journal of Solid-State Circuits > 2014 > 49 > 1 > 232 - 247
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 536 - 544
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4145 - 4152
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 781 - 783
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 493 - 498
IEEE Transactions on Industrial Electronics > 2014 > 61 > 10 > 5615 - 5621
Analog Integrated Circuits and Signal Processing > 2014 > 79 > 2 > 219-226
Microelectronics Reliability > 2014 > 54 > 1 > 64-70
Microelectronics Reliability > 2014 > 54 > 1 > 71-78