Search results for: M. Roisenberg
Metrology and Measurement Systems > 2016 > Vol. 23, nr 2 > 281--294
2009 International Joint Conference on Neural Networks > 2238 - 2242
2008 4th International IEEE Conference Intelligent Systems > 3 > 19-2 - 19-7
2008 International Conference on Machine Learning and Cybernetics > 4 > 2440 - 2445