Search results for: V. Zahlava
Microelectronics Reliability > 2017 > 74 > C > 58-66
Solid State Electronics > 2014 > 94 > Complete > 32-38
IEEE Transactions on Nuclear Science > 2014 > 61 > 6-1 > 3030 - 3036
Microelectronics Reliability > 2011 > 51 > 3 > 566-571
Microelectronics Reliability > 2010 > 50 > 1 > 32-38
Nuclear Inst. and Methods in Physics Research, B > 2009 > 267 > 17 > 2832-2838