Search results for: Hun Shen Ng
Microelectronics Reliability > 2010 > 50 > 7 > 928-936
2008 10th Electronics Packaging Technology Conference > 1086 - 1095
Journal of Electronic Materials > 2007 > 36 > 2 > 110-116
Microelectronics Reliability > 2006 > 46 > 12 > 2131-2138
Microelectronics Reliability > 2004 > 44 > 7 > 1131-1142
Microelectronics Reliability > 2003 > 43 > 8 > 1329-1338
Microelectronics Reliability > 2003 > 43 > 7 > 1117-1123