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In the nanotechnology sector there is a strong need for non-destructive testing instruments that can reveal the inner structure of objects. For such applications we developed a concept for a novel nanometer-resolution X-ray computed tomography (CT) system, which does not rely on the use of X-ray optics. We target a resolution in the range of existing nano CT setups (50 to 150 nm) while increasing...
In this paper we present a mono pixel detector with a very high dynamic range for measuring the X-ray flux. The flux monitor system is mainly designed for supplementing and improving existing X-ray systems. When using such monitor devices additionally to other X-ray detectors, the monitor signal has to be calibrated versus the detector signal. A suitable calibration routine and its results are shown...
In recent years X-ray tomography has made progressive steps towards spatial resolution in the sub-micron range. A limiting factor is the finite focal spot size of state-of-the-art microfocus tubes. In this contribution we present a radiography setup with an X-ray source capable of generation focal spot sizes down to 80 nm, thanks to special targets designed using Monte Carlo simulations. Together...
Radioscopy and computed tomography in medical applications are well established and have reached a high level of development. Compared to medical applications industrial nondestructive-testing (NDT) has to deal with a large variety of different materials and material combinations, densities and density dynamics, geometries and structures which need to be inspected. This large variation necessitates...
Micro-CT with resolutions in the order of 1 μm is readily available nowadays but below 1 μm the maximum achievable resolution is not only limited by the components parameters like pixel size and focal spot size but also depends strongly on the stability of the whole CT system. We present the performance of our Sub-μm CT based on commercially available components and will show that it is possible to...
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