Search results for: Z. Al-Ars
2010 5th International Design and Test Workshop > 134 - 139
2010 5th International Design and Test Workshop > 155 - 160
2008 3rd International Design and Test Workshop > 135 - 140
2008 3rd International Design and Test Workshop > 231 - 235
2008 3rd International Design and Test Workshop > 225 - 230
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2008 > 16 > 6 > 725 - 732