Search results for: Ming-Dou Ker
Microelectronics Reliability > 2012 > 52 > 11 > 2627-2631
10th IEEE International NEWCAS Conference > 125 - 128
Microelectronics Reliability > 2012 > 52 > 6 > 1020-1030
2012 IEEE International Reliability Physics Symposium (IRPS) > EL.3.1 - EL.3.5
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 3 > 554 - 561
IEEE Transactions on Circuits and Systems II: Express Briefs > 2012 > 59 > 3 > 178 - 182
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 10 - 14
IEEE Transactions on Electron Devices > 2012 > 59 > 10 > 2626 - 2634
IEEE Transactions on Industrial Electronics > 2012 > 59 > 2 > 1278 - 1287
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3456 - 3463
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 382 - 390