Search results for: J. Velasco-Medina
Journal of Electronic Testing > 2012 > 28 > 2 > 189-200
2010 IEEE ANDESCON > 1 - 6
2010 IEEE ANDESCON > 1 - 6
2010 15th IEEE European Test Symposium > 195 - 200
2009 IEEE Congress on Evolutionary Computation > 150 - 157
AFRICON 2007 > 1 - 7