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This paper studies long-term effects produced by ionizing radiation in a switched-capacitor filter, using the oscillation based test (OBT) approach by Huertas et al. (2006). In this case, threshold voltage shifting is considered as one of the major concerning effects produced by total ionizing dose (TID). Simulation results show that the OBT approach is very well suited for detection of faulty filters.
This paper studies the effects produced by radiation single event transient (SET) injected in the transistors of a custom operational amplifier, in order to evaluate their sensitivity to the radiation transient faults. A BID (built-in detector), was included in the circuit in order to amplify and detect the SETs effect. The circuit was designed using a non-rad- hard AMS-CMOS 0.8 mum process. In this...
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