Search results for: Yangbo Yi
IET Circuits, Devices & Systems > 2016 > 10 > 5 > 410 - 416
IEEE Electron Device Letters > 2015 > 36 > 7 > 693 - 695
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 523 - 528
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3814 - 3820
IET Circuits, Devices & Systems > 2014 > 8 > 6 > 509 - 515
Microelectronics Reliability > 2008 > 48 > 11-12 > 1804-1808
IEEE Electron Device Letters > 2007 > 28 > 12 > 1135 - 1137
IEEE Electron Device Letters > 2007 > 28 > 7 > 631 - 633
Microelectronics Reliability > 2006 > 46 > 5-6 > 1001-1005
Microelectronic Engineering > 2004 > 71 > 1 > 112-118