Search results for: J. Sune
Conference on Electron Devices, 2005 Spanish > 393 - 396
Conference on Electron Devices, 2005 Spanish > 397 - 400
Microelectronic Engineering > 2004 > 72 > 1-4 > 16-23
Microelectronics Reliability > 2003 > 43 > 8 > 1185-1192
Microelectronics Reliability > 2003 > 43 > 8 > 1175-1184
Solid State Electronics > 2002 > 46 > 11 > 1787-1798
Microelectronic Engineering > 2001 > 59 > 1-4 > 25-31
Solid State Electronics > 2001 > 45 > 8 > 1317-1325
Solid State Electronics > 2001 > 45 > 8 > 1327-1332
Microelectronics Reliability > 2000 > 40 > 8-10 > 1599-1603
Microelectronics Reliability > 2000 > 40 > 4-5 > 687-690
Microelectronics Reliability > 2000 > 40 > 4-5 > 707-710
Solid State Electronics > 1999 > 43 > 9 > 1801-1805
Microelectronics Reliability > 1999 > 39 > 6-7 > 891-895
Solid State Electronics > 1999 > 43 > 2 > 315-323
Microelectronics Reliability > 1999 > 39 > 2 > 161-164
Microelectronics Reliability > 1998 > 38 > 6-8 > 1127-1131